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18th IEEE European Test Symposium
(ETS 2012)

May 27-31, 2013
Conference Center of the Popes’ Palace, Avignon, France

http://www.ieee-ets.org

CALL FOR PAPERS
Scope -- Submissions -- Key Dates -- Additional Information -- Committees
Scope

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics and new trends in the area of electronic-based circuits and system testing. A Test Spring School will be organized in conjunction with ETS’13. In 2013, ETS will take place in the Conference Center of the Popes’ Palace in the beautiful and historic city of Avignon, France, and is organized by LIRMM and co-sponsored by the University of Montpellier 2, the CNRS and the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

You are invited to participate and submit contributions to ETS’13. The areas of interest include (but are not limited to) the following topics.

  • Analog Test
  • ATE Hardware and Software
  • Automatic Test Generation
  • Board Test and Diagnosis
  • Boundary Scan Test
  • Built-In Self Test (BIST)
  • Current-Based Test
  • Defect-Based Test
  • Delay and Performance Test
  • Dependability
  • Design for Test(ability) – DfT
  • Design Verification and Validation
  • Diagnosis and Debug
  • Economics of Test
  • Failure Analysis
  • Fault Modeling and Simulation
  • Fault Tolerance
  • High-Speed I/0 Test
  • Low-Power IC Test
  • Memory Test and Repair
  • MEMS Test
  • Microprocessor Test
  • Mixed-Signal Test
  • Nanotechnology Test
  • On-line Test
  • Power Issues in Test
  • Reliability
  • RF Test
  • Self-Repair
  • Signal Integrity Test
  • Stacked or 3D ICs Test
  • Standards in Test
  • System Test
  • SiP and SoC Test
  • Test(ability) Synthesis
  • Test of Reconfigurable Systems
  • Test of Secured ICs
  • Test Quality
  • Thermal Issues in Test
  • Transient and Soft Errors
  • Yield Analysis and Enhancement

Publications – ETS’13 will produce a Formal Proceedings of selected papers and an Informal Digest of Papers. The best contributions will be selected for submission to regular issues of the “Journal of Electronic Testing: Theory and Applications (JETTA),” published by Springer and “IEEE Design & Test of Computers.” A Best Paper Award of ETS’13 will be presented at ETS’14.

Submissions

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ETS’13 seeks original, unpublished contributions of the following types:

  • Scientific papers for the Formal Proceedings, presenting novel and complete research work.
  • Workshop-type papers for the Informal Digest, including emerging ideas and case studies.
  • Proposals for panels, embedded tutorials, and other special sessions.
  • Vendor presentations focusing on new features of test related products.
  • PhD student work-in-progress presenting their on-going work.

Detailed submission instructions, including selection criteria and publication policies for the various types of contributions, are posted on the ETS’13 web page.

The ETS’13 organizing committee also encourages the organization of fringe meetings and workshops. Visit ETS’13 web page at: http://www.ieee-ets.org for more information.
Key Dates

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Submission deadline: December 3, 2012
Notification of acceptance: February 20, 2013
Final copy deadline: April 1, 2013

Additional Information
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Patrick Girard  – General Chair
LIRMM
161, rue Ada
34392 Montpellier cedex 5, France
Tel.: +33-467-418-629
Fax: +33-467-418-500
Email: girard@lirmm.fr

 

 Zebo Peng – Program Chair
Dept. of Computer and Information Science
Linköping University
SE-581 83 Linköping, Sweden
Tel.: +46-13-282067
Fax: +46-13-284499
E-mail: zebo.peng@liu.se

Committees
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General Chair
P. Girard – LIRMM (FR)

Vice General Chair
S. Hellebrand – Paderborn U. (DE)

Program Chair
Z. Peng – Linköping U. (SE)

Vice Program Chair
M. Sonza Reorda – Pol. di Torino (IT)

Local Organization Chair
A. Virazel – LIRMM (FR)

Panel Chair
M. Violante – Pol. di Torino (IT)

Embedded Tutorial Chair
L. Anghel – TIMA (FR)

Student Activity Chair
J. Raik – Tallinn UT (EE)

Industrial Liaison Chair
S. Hamdioui – TU Delf (NL)

Publication Chair
G. Di Natale – LIRMM (FR)

Fringe Workshops Chair
I. Polian – Passau U. (DE)

Award Chair
M. Renovell – LIRMM (FR)

International Liaisons
South America: E. Cota – UFRGS (BR)
Asia: X. Li – CAS (CN)
South Pacific: A. Osseiran – ECU (AU)
North America: A. Singh – Auburn U. (US)
MENA: O. Sinanoglu – NYU (UAE)

Topic Chairs
B. Becker – Freiburg U. (DE)
L. Carro – UFRGS (BR)
K. Chakrabarty – Duke U. (US)
H. Kerkhoff  – Twente U. (NL)
E. Larsson – Lund U. (SE)
C. Metra – Bologna U. (IT)
S. Mir – TIMA (FR)
J. Rivoir – Advantest (DE)
J. Tyszer – Poznan Tech. U. (PL)
B. Vermeulen – NXP Semiconductors (NL)

Test Spring School Chairs
P. Prinetto – Pol. di Torino (IT)
H.-J. Wunderlich – Stuttgart U. (DE)

Organizing Committee – LIRMM (FR)
Audio/Visual – A. Todri
Proceedings – L. Latorre
Publicity – L. Dilillo
Registration – S. Bernard
Test Spring School – M. Comte
Web – A. Bosio

Steering Committee
Chair: H.-J. Wunderlich (DE)
L. Anghel (FR)
D. Appello (IT)
B. Becker (DE)
J. Figueras (ES)
P. Girard (FR)
P. Harrod (UK)
L. Huertas (ES)
H. Manhaeve (BE)
E. J. Marinissen (BE)
Z. Peng (SE)
P. Prinetto (IT)
M. Renovell (FR)
M. Sonza Reorda (IT)
Y. Zorian (US)

For more information, visit us on the web at: http://www.ieee-ets.org

The 18th IEEE European Test Symposium (ETS 2012) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

PAST CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

TTTC 1ST VICE CHAIR
Cecilia METRA
Università di Bologna - Italy
Tel. +39-051-209-3038
E-mail cmetra@deis.unibo.it

SECRETARY
Joan FIGUERAS
UPC Barcelona Tech - Spain
Tel. +
E-mail figueras@eel.upc.edu

ITC GENERAL CHAIR
Doug YOUNG
BVC Industrial - USA
Tel. +1-602-617-0393
E-mail doug0037@aol.com

TEST WEEK COORDINATOR
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Athens
- Greece
Tel. +30-210-7275145
E-mail dgizop@di.uoa.gr

STANDARDS
Rohit KAPUR

Synopsys
, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Matteo SONZA REORDA
Politecnico di Torino - Italy
Tel.+39-011-564-7055
E-mail matteo.sonzareorda@polito.it

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

ELECTRONIC MEDIA
Giorgio DI NATALE
LIRMM - France
Tel. +33-4-6741-8501
E-mail giorgio.dinatale@lirmm.fr

 

PRESIDENT OF BOARD
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

SENIOR PAST CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

TTTC 2ND VICE CHAIR
Rohit KAPUR
Synopsys
, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

FINANCE
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

IEEE DESIGN & TEST EIC
Krish CHAKRABARTY
Duke University - USA
Tel. +1-
E-mail krish@ee.duke.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG
Alcatel-Lucent
- USA
Tel. +1-973-386-6759
E-mail chen-huan.chiang@alcatel-lucent.com

TECHNICAL ACTIVITIES
Patrick GIRARD
LIRMM – France
Tel.+33 467 418 629
E-mail patrick.girard@lirmm.fr

ASIA & PACIFIC
Kazumi HATAYAMA
NAIST - Japan
Tel. +81 743 72 5221
E-mail k-hatayama@is.naist.jp

LATIN AMERICA
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

NORTH AMERICA
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

COMMUNICATIONS
Cecilia METRA
Università di Bologna - Italy
Tel. +39-051-209-3038
E-mail cmetra@deis.unibo.it

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com